Dimension FastScan™ 原子力显微镜 (AFM)在不损失Dimension® Icon®超高的分辨率和**的仪器性能前提下，**限度的提高了成像速度。这项突破性的技术创新，从根本上解决了AFM成像速度慢的难题，大大缩短了各技术水平的AFM用户获得数据的时间。 为提高AFM使用效率和检测 ...

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Its large-sample architecture offers ultimate sample flexibility while maintaining all the industry-best atomic force microscopy (AFM) measurement capabilities of the Dimension Icon ®. The Dimension ...

The Icon ® and FastScan ® platforms have three distinct Dimension XR configurations that offer cutting-edge research capabilities in improved packages: Globally, there are thousands of peer-reviewed ...

Based upon the highly successful Dimension Icon® AFM architecture, the FastScan AFM is a tip-scanning system that provides measurements on both large and small size samples in air or fluids. Now, with ...

leveraging decades of AFM innovation and close partnerships with users. The Dimension Icon, serving as the flagship model, sets the benchmark for performance in the commercial AFM market.