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Its large-sample architecture offers ultimate sample flexibility while maintaining all the industry-best atomic force microscopy (AFM) measurement capabilities of the Dimension Icon ®. The Dimension ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Bruker's Dimension Icon AFM integrates the ...
It is also used in measurements of surface and adhesion forces. The Veeco Dimension 3000 atomic force microscope (AFM) is used to analyze a variety of sample sizes and types. It can function in air or ...
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