The Icon has been designed from top to bottom to deliver revolutionary low drift and low noise that allows users to achieve artifact-free images in minutes instead of hours, enabling increased ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure Bruker's Dimension Icon AFM integrates the ...

Sample size: 210mm diameter and 15mm thickness maximum. The Bruker Dimension ICON large-sample AFM is an easy to use, high resolution instrument capable of AFM modes including contact, tapping, and ...

Based upon the highly successful Dimension Icon® AFM architecture, the FastScan AFM is a tip-scanning system that provides ... will enable you to scan once and get all the details you need. Contact ...

NEW Dimension Nexus - best-in-class general purpose AFM. Image Credit: Bruker Nano Surfaces and Metrology Dimension Icon - gold standard for advanced large-sample AFMs. Image Credit: Bruker Nano ...

Follow Bruker and explore the latest applications of AFM in the semiconductor industry with a panel of experts. We propose using Bruker’s sharp, high-performance cantilevers, such as the HPI ...

Join Bruker Nano Surfaces for a live webinar introducing the new Dimension Nexus AFM. Experts will provide an overview of the unique features and capabilities that contribute to this cost ...

Since the AFM-IR technique was first developed, Bruker and its collaborators have developed several AFM-IR modes, including Resonance-Enhanced mode, Tapping AFM-IR mode, Surface Sensitive mode ...