Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Chinese researchers are exploring the potential of organic materials to develop a new type of hard drive that could potentially store six times the amount of data compared to current mechanical models ...

Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a new module for the Nano-Observer II AFM system. This move represents a ...

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Using the functional probes, the advanced modes—electrostatic force microscopy (EFM_, magnetic FM (MFM), and conductive AFM (C-AFM)—are also accessible. Kelvin probe FM (KPFM) and Scanning Thermal ...

AFM analysis of hydrated samples/liquid medium The atomic force microscope's ability to measure conductive or non-conductive samples in air allows for characterization of complex polymers and ...

FastScan Pro, from standard AFM modes to the newest PeakForce Tapping modes, provides excellent flexibility and the widest range to meet specific characterization and measurement requirements on ...

SPM techniques share the common approach of scanning a probe over a specimen's surface to gather information. While STM provides unparalleled atomic-resolution images of conductive and semiconductive ...

Numerous SPM modes are available, including AFM, conductive and electrical modes (cAFM, KPFM), STM, liquid cell and electrochemical environment, and chemical mapping via TERS/TEPL. Full control of the ...