Section 4 discusses Design for testability, as creating power aware scan chains. The scan chains are created depending upon the power domains and Daisy chain approach to provide effective power aware ...

The recent increase in the technology usage and the competition to acquire global market has cornered the industry to move into lower Technological nodes with higher increase in Transistor’s per die, ...

Optimize AI accelerators with efficient design and test methodologies. Explore strategies for streamlining DFT and silicon ...