Schematic illustration of Friction Force Microscopy (FFM). The AFM cantilever ... However, in FFM, the focus is on measuring the lateral deflection of the cantilever, which arises from the friction ...

Magnetic Force Microscopy (MFM) is a scanning probe microscopy technique ... The magnetic forces cause the cantilever to deflect, and the deflection is recorded as a function of the lateral position, ...

Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Dimension 3000 operates in both tapping and contact modes, with capabilities of topographic and phase imaging, lateral force ...

Within a decade, this unconventional microscope has evolved ... thereby permitting smaller forces to be measured, while finer nanotube tips may help improve the lateral resolution.

Atomic force microscopy (AFM), known for its nanometer ... such as Alzheimer's Disease (AD), Parkinson's Disease (PD) and ...

The domain patterns were studied using vertical and lateral piezoresponse force microscopy (PFM). "Both the PFM measurement data and the phase field modeling indicate a centered, downward ...

Escherichia coli bacteria imaged by high-speed inline force mapping and fluorescence microscopy. Simultaneous topography and ...

Lateral Force Microscopy (LFM); Magnetic Force Microscopy (MFM); Conductive AFM (optional); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Force curve measurement; Capacitance and Electric ...

Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non-contact AFM; Lateral Force Microscopy (LFM); Phase imaging; Conductive AFM (optional); Force Modulation; Magnetic ...