Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Traditional Conductive AFM (C-AFM) seems to be moving aside to make space for a more advanced technology: ResiScope III – a ...

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An extremely sharp conducting tip, often made of tungsten or platinum-iridium ... While STM provides unparalleled atomic-resolution images of conductive and semiconductive surfaces, AFM and SNOM ...