XPS is used to determine the atoms present at a surface and their concentrations ... spin-orbit splitting, chemical shift, curve fitting using software, plasmons, multiplet splitting, shake-up, data ...
一些您可能无法访问的结果已被隐去。
显示无法访问的结果一些您可能无法访问的结果已被隐去。
显示无法访问的结果