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美国赛默飞聚焦离子束扫描电镜(FIB-SEM)_Scios 2
Scios 2 DualBeam 提供最佳的样品制备、内部及三维表征性能,可满足最广泛类型样品的应用需求。 Thermo Scientifc™ Scios™ 2 DualBeam™ 系统是一款超高分辨率分析系统,可为最广泛类型的样品(包括磁性和不导电材料)提供出色的样品制备和三维表征性能。Scios 2 ...
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