Miteshwar M. Patel (ASIC Engineer, eInfochips Ltd) Nirav Nanavati (Tech Lead, eInfochips Ltd) Abstract Design for testability (DFT) and low power issues are very much related with each other. In this ...

The paper describes the design-for-test (DFT) features of a 10.3125Gb/s Serdes and other such high datarate IP as XAUI, PCIe, and others. It is shown that extensive testability can be implemented in a ...

What does that mean for the services we use? And how can we design new such applications? Just as one needs to have a basic understanding of the strength of different materials to design buildings, we ...

They're psychological triggers that can make or break your entire marketing strategy. Think I'm exaggerating? Let me share a quick story from my days running Inkbot Design. We once worked with a tech ...

MA Design for Data Visualisation is driven by the intelligent interrogation of data and intensive, practice-led research. Using a range of media, tools and techniques, you will research, interpret, ...